Oscillation-Based Test Technique for Analog Cores in Mixed-Signal Integrated Circuits Using the Field Programmable Analog Array Technology

Modern System-on-Chip (SoC) designs are increasingly mixed-signal Very Large Scale Integrated (VLSI) designs that require efficient design and testing methodologies to manage the design complexity and the time-to-market constraints. Also, in mixed-signal integrated circuits (ICs), testing analog cores is the most difficult task and it’s one of the major cost factors in the overall IC manufacturing cost. Hence, developing testing approaches that reduce the test cost and accelerate the time-to-market is too challenging. This paper presents an oscillation based test technique implemented using the FieldProgrammable Analog Array (FPAA) technology. In fact, using the proposed approach we will distinguish a faulty circuit from a fault-free one by controlling the oscillation frequency of the Circuit under Test (CUT). Actually, faults that occur in the CUT can be detected by checking whether the oscillation frequency has deviated from its nominal value. The system is practically designed and simulated by using the AN221E04 board which is an Anadigm product. The circuit validation was carried out using the AnadigmDesigner®2 software. Simulation results show that the proposed testing technique is effective and can be used to reduce the design and testing costs of mixed-signal ICs.